Monday - September 28, 2020
Adani Systems Assigned Patent for X-ray Defectoscope (Defect Scanner) for Protective Clothing
Copyright © Targeted News Service, 2020
2020-09-14
ALEXANDRIA, Va., Sept. 14 -- Adani Systems, Alexandria, Virginia, has been assigned a patent (No. 10,768,123, initially filed Aug. 30, 2018) by two co-inventors for "X-ray defectoscope (defect scanner) for protective clothing." The co-inventors are Vladimir N. Linev, Minsk, Belarus, and Leonid Kourtch, Minsk, Belarus.

The full-text of the patent can be found at http://patft.uspto.gov/netacgi/nph-Parser?Sect1=PTO1&Sect2=HITOFF&d=PALL&p=1&u=%2Fnetahtml%2FPTO%2Fsrchnum.htm&r=1&f=G&l=50 . . .

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