Thursday - March 28, 2024
Adani Systems Assigned Patent for X-ray Defectoscope (Defect Scanner) for Protective Clothing
Copyright © Targeted News Service, 2020
2020-09-14
ALEXANDRIA, Va., Sept. 14 -- Adani Systems, Alexandria, Virginia, has been assigned a patent (No. 10,768,123, initially filed Aug. 30, 2018) by two co-inventors for "X-ray defectoscope (defect scanner) for protective clothing." The co-inventors are Vladimir N. Linev, Minsk, Belarus, and Leonid Kourtch, Minsk, Belarus.

The full-text of the patent can be found at http://patft.uspto.gov/netacgi/nph-Parser?Sect1=PTO1&Sect2=HITOFF&d=PALL&p=1&u=%2Fnetahtml%2FPTO%2Fsrchnum.htm&r=1&f=G&l=50 . . .

Targeted News Service Document Request Form

This document is available to you by e-mail if you complete the form below with relevant information. There may be a fee for this article or ongoing service of similar materials. We will be in touch shortly.

Name:
What's your
Affiliation
Government Newspaper / Media Business
Public Policy Individual / Student Educators
Email:
Phone:
Organization, if any:
State/Country you are in:
Additonal questions
or comments:

Click here for more information about our products

Click here for more information or a free trial

Copyright Targeted News Service 2020