Sunday - October 4, 2026

Method and Apparatus for Determining a Force Applied to a Sample During an Optical Interrogation Technique

2026-09-29

ALEXANDRIA, Virginia, Sept. 29 -- Five inventors William Robert Keefe, Oconomowoc, Wisconsin; Gang Feng, Verona, Wisconsin; Min Yan, Verona, Wisconsin; William Bayer, Black Earth, Wisconsin; and Peter Steinberg, Madison, Wisconsin, have been awarded a patent (No. US 12748046 B2, initially filed May 20, 2024) for "Method and apparatus for determining a force applied to a sample during an optical interrogation technique." . . .

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Method and Apparatus for Determining a Force Applied to a Sample During an Optical Interrogation Technique

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