Thursday - September 10, 2026

AI Driven System for X-Ray Analysis of Various Products and Identifying Defects Within

2026-09-08

ALEXANDRIA, Virginia, Sept. 8 -- TECHOLUTION CONSULTING LLC, New York, New York has been assigned a patent (No. US 12731254 B2, initially filed May 2, 2024) developed by Luv Tulsidas, New York, New York, and Asher Williams, New York, New York, for "AI driven system for x-ray analysis of various products and identifying defects within." . . .

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AI Driven System for X-Ray Analysis of Various Products and Identifying Defects Within

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