Wednesday - June 3, 2026

Non-Destructive X-Ray Imaging Detector Utilizing Artificial Intelligence to Optimize System Efficiency

2026-06-02

ALEXANDRIA, Virginia, June 2 -- X-SCAN IMAGING CORPORATION, San Jose, California has been assigned a patent (No. US 12642500 B2, initially filed June 25, 2024) developed by five inventors Randall Arthur, Campbell, California; Anthony E. Dimalanta, San Jose, California; Nguyen Phuoc Luu, Los Gatos, California; Paul R. Overmyer, Sunnyvale, California; and Chinlee Wang, Saratoga, California, for "Non-destructive x-ray imaging detector utilizing artificial intelligence to optimize system efficiency . . .

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Non-Destructive X-Ray Imaging Detector Utilizing Artificial Intelligence to Optimize System Efficiency

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