Wednesday - May 27, 2026

AI System for Wafer Defect Detection

2026-05-26

ALEXANDRIA, Virginia, May 26 -- APPLE T CO., LTD., Yongin-si, South Korea has been assigned a patent (No. US 12638838 B2, initially filed Dec. 5, 2023) developed by Han Chul Lee, Cheongju-si, South Korea, for "AI system for wafer defect detection." . . .

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AI System for Wafer Defect Detection

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