Saturday - August 30, 2025

Inline Monitoring System for Process Defects During Manufacturing

2025-08-12

ALEXANDRIA, Virginia, Aug. 12 -- THE FLORIDA INTERNATIONAL UNIVERSITY BOARD OF TRUSTEES, Miami, Florida has been assigned a patent (No. US 12389550 B1, initially filed Feb. 14, 2025) developed by five inventors Markondeyaraj Pulugurtha, Miami, Florida; Satheesh Bojja Venkatakrishnan, Miami, Florida; John Volakis, Miami, Florida; Peeyush Awasthi, Miami, Florida; and Anthony Giordano, Miami, Florida, for "Inline monitoring system for process defects during manufacturing." . . .

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Inline Monitoring System for Process Defects During Manufacturing

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