Artificial Intelligence (AI)-based Method for Non-Contact Measurement of Sheet Resistance of a Conductive Film Material
Copyright © Targeted News Service 2025
2025-07-08
ALEXANDRIA, Virginia, July 8 -- NORTH UNIVERSITY OF CHINA, Taiyuan, China has been assigned a patent (No. US 12354007 B2, initially filed Jan. 17, 2025) developed by three inventors Yaqing Liu, Taiyuan, China; Guanyu Han, Taiyuan, China; and Guizhe Zhao, Taiyuan, China, for "Artificial intelligence (AI)-based method for non-contact measurement of sheet resistance of a conductive film material." . . .
