Tuesday - July 1, 2025

Defect Detection Using Synthetic Data and Machine Learning

2025-06-24

ALEXANDRIA, Virginia, June 24 -- JOHNSON & JOHNSON VISION CARE, INC., Jacksonville, Florida has been assigned a patent (No. US 12340498 B2, initially filed April 10, 2024) developed by Edward R. Kernick, St. Johns, Florida, and Peter Cerreta, Jacksonville, Florida, for "Defect detection using synthetic data and machine learning." . . .

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Defect Detection Using Synthetic Data and Machine Learning

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