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Layer-Based Defect Detection Using Normalized Sensor Data

2024-08-06

ALEXANDRIA, Virginia, Aug. 6 -- DIVERGENT TECHNOLOGIES, INC., Los Angeles, California has been assigned a patent (No. US 12053841 B2, initially filed July 14, 2021) developed by Vivek R. Dave, Concord, New Hampshire, and Mark J. Cola, Santa Fe, New Mexico, for "Layer-based defect detection using normalized sensor data." . . .

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Layer-Based Defect Detection Using Normalized Sensor Data

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