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Defect Detection for Additive Manufacturing Systems

2024-01-02

ALEXANDRIA, Virginia, Jan. 2 -- SIGMA ADDITIVE SOLUTIONS, INC., Santa Fe, New Mexico has been assigned a patent (No. US 11858207 B2, initially filed Feb. 21, 2023) developed by four inventors Vivek R. Dave, Concord, New Hampshire; R. Bruce Madigan, Butte, Montana; Mark J. Cola, Santa Fe, New Mexico; and Martin S. Piltch, Los Alamos, New Mexico, for "Defect detection for additive manufacturing systems." . . .

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Defect Detection for Additive Manufacturing Systems

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