Duke University Pratt School of Engineering: Study Finds Next-Generation Transistor Performance Inflated in Most Lab Testing
February 28, 2026
February 28, 2026
DURHAM, North Carolina, Feb. 28 (TNSjou) -- Duke University Pratt School of Engineering issued the following news:
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Study Finds Next-Generation Transistor Performance Inflated in Most Lab Testing
Duke engineers show how a common device architecture used to test 2D transistors overstates up to sixfold their performance prospects in real-world devices.
Andrew Tie
For nearly two decades, two dimensional (2D) semiconductors have b . . .
* * *
Study Finds Next-Generation Transistor Performance Inflated in Most Lab Testing
Duke engineers show how a common device architecture used to test 2D transistors overstates up to sixfold their performance prospects in real-world devices.
Andrew Tie
For nearly two decades, two dimensional (2D) semiconductors have b . . .