Rice researchers automate defect detection in diamond, other advanced semiconductors
June 24, 2026
June 24, 2026
HOUSTON, Texas, June 24 -- Rice University posted the following news release:
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Rice researchers automate defect detection in diamond, other advanced semiconductors
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Materials scientists at Rice University have developed a new workflow methodology for measuring microscopic defects in diamond and other advanced semiconductor materials. By making it easier to spot flaws that can undermine performance, the approach could accelerate the develo . . .
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Rice researchers automate defect detection in diamond, other advanced semiconductors
*
Materials scientists at Rice University have developed a new workflow methodology for measuring microscopic defects in diamond and other advanced semiconductor materials. By making it easier to spot flaws that can undermine performance, the approach could accelerate the develo . . .