Electron microscopy shows 'mouse bite' defects in semiconductors
March 02, 2026
March 02, 2026
ITHACA, New York, March 2 -- Cornell University posted the following news:
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Electron microscopy shows 'mouse bite' defects in semiconductors
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Cornell researchers have used high-resolution 3D imaging to detect, for the first time, the atomic-scale defects in computer chips that can sabotage their performance.
The imaging method, which was the result of a collaboration with Taiwan Semiconductor Manufacturing Company . . .
* * *
Electron microscopy shows 'mouse bite' defects in semiconductors
*
Cornell researchers have used high-resolution 3D imaging to detect, for the first time, the atomic-scale defects in computer chips that can sabotage their performance.
The imaging method, which was the result of a collaboration with Taiwan Semiconductor Manufacturing Company . . .