New technique spots hidden defects to boost reliability of ultrathin electronics
February 26, 2026
February 26, 2026
HOUSTON, Texas, Feb. 26 -- Rice University posted the following news release:
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New technique spots hidden defects to boost reliability of ultrathin electronics
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Future devices will continue to probe the frontier of the very small, and at scales where functionality depends on mere atoms, even the tiniest flaw matters.
Researchers at Rice University have shown that hard-to-spot defects in a widely used two-dimensional insulato . . .
* * *
New technique spots hidden defects to boost reliability of ultrathin electronics
*
Future devices will continue to probe the frontier of the very small, and at scales where functionality depends on mere atoms, even the tiniest flaw matters.
Researchers at Rice University have shown that hard-to-spot defects in a widely used two-dimensional insulato . . .