Friday - April 4, 2025
Keysight Enables Dynamic Test on a Wide-Bandgap Power Semiconductor Bare Chip
March 15, 2025
SANTA ROSA, California, March 15 -- Keysight Technologies, a global electronic measurement technology and market solutions provider, issued the following news release:

* * *

Keysight Enables Dynamic Test on a Wide-Bandgap Power Semiconductor Bare Chip

* Easily and accurately measure dynamic characteristics on a Wide-Bandgap power semiconductor bare chip without soldering or probe needles

* Keysight fixture enables quick, repeated test without d . . .

Targeted News Service Document Request Form

This document is available to you by e-mail if you complete the form below with relevant information. There may be a fee for this article or ongoing service of similar materials. We will be in touch shortly.

Name:
What's your
Affiliation
Government Newspaper / Media Business
Public Policy Individual / Student Educators
Email:
Phone:
Organization, if any:
State/Country you are in:
Additonal questions
or comments:

Click here for more information about our products

Click here for more information about our products