Researchers Demonstrate 3D X-Ray Imaging of Integrated Circuits With a Record 4nm Resolution
August 17, 2024
August 17, 2024
LOS ANGELES, California, Aug. 17 (TNSres) -- The University of Southern California Viterbi School of Engineering issued the following news:
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Offers potential for new era of non-destructive metrology for chip manufacturing.
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Guaranteeing that computer chips, consisting of billions of interconnected transistors, are manufactured without defects is a challenge. But how does one determine if a chip is compromised? Now, an updated techniqu . . .
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Offers potential for new era of non-destructive metrology for chip manufacturing.
* * *
Guaranteeing that computer chips, consisting of billions of interconnected transistors, are manufactured without defects is a challenge. But how does one determine if a chip is compromised? Now, an updated techniqu . . .