Decoding Ultrafast Light Dynamics With Atomic Force Microscopy
July 20, 2024
July 20, 2024
NOVELTY, Ohio, July 20 (TNSres) -- ASM International posted the following news:
An improved technique for analyzing single-atom defect structures and minor electron behavior disturbance in semiconductor and other materials has been demonstrated by researchers in Japan. The time-resolved atomic force microscopy (AFM) system overcomes the time resolution limitations of currently used scanning tunneling microscopy methods.
Combining AFM with ultrashort laser pulse technolo . . .
An improved technique for analyzing single-atom defect structures and minor electron behavior disturbance in semiconductor and other materials has been demonstrated by researchers in Japan. The time-resolved atomic force microscopy (AFM) system overcomes the time resolution limitations of currently used scanning tunneling microscopy methods.
Combining AFM with ultrashort laser pulse technolo . . .