New Method Developed for Measuring Thermal Expansion in 'Atomically Thin' Materials
June 28, 2024
June 28, 2024
WASHINGTON, June 28 (TNSres) -- The U.S. Department of Energy's Los Alamos National Laboratory issued the following news:
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Technique addresses key issue in performance of material for microelectronics
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Advanced materials, including two-dimensional or "atomically thin" materials just a few atoms thick, are essential for the future of microelectronics technology. Now a team at Los Alamos National Laboratory has developed a way . . .
* * *
Technique addresses key issue in performance of material for microelectronics
* * *
Advanced materials, including two-dimensional or "atomically thin" materials just a few atoms thick, are essential for the future of microelectronics technology. Now a team at Los Alamos National Laboratory has developed a way . . .