Sunday - September 27, 2020
Allegro MicroSystems Assigned Patent for Magnetic Field Sensors for Determining Position Magnet (9/26/20)
Allegro MicroSystems Assigned Patent for Magnetic Field Sensors with Self-Test (9/26/20)
Allegro MicroSystems Assigned Patent for Motor Controller with Accurate Current Measurement (9/26/20)
Allegro MicroSystems Assigned Patent for Multi-Channel Sensor Output Signal Protocols (9/26/20)
Anvil International Assigned Patent for Pipe Clamp (9/26/20)
API Heat Transfer Assigned Patent for Heat Exchanger with Cooling Medium Bar (9/26/20)
BAE Systems Information & Electronic Systems Integration Assigned Patent for Aircraft Derived Spread Spectrum Landing System (9/26/20)
BAE Systems Information & Electronic Systems Integration Assigned Patent for Dynamic Weapon to Target Assignment (9/26/20)
BAE Systems Information & Electronic Systems Integration Assigned Patent for Orthoscopic Projection Lens (9/26/20)
BAE Systems Information & Electronic Systems Integration Assigned Patent for Ultra-Wide Bandwidth Frequency-Independent Circularly Polarized Array Antenna (9/26/20)
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Patents Assigned to Companies

News coverage, by state, of federal patent awards to individuals and to companies assigned patents.

Featured Stories
Altria Client Services Assigned Patent for Aerosol-Generating System Having Variable Airflow
ALEXANDRIA, Va., Sept. 14 -- Altria Client Services, Richmond, Virginia, has been assigned a patent (No. 10,765,149, initially filed Nov. 14, 2017) developed by Tony Reevell, London, United Kingdom, for an "aerosol-generating system having variable airflow."

The full-text of the patent can be found at http://patft.uspto.gov/netacgi/nph-Parser?Sect1=PTO1&Sect2=HITOFF&d=PALL&p=1&u=%2Fnetahtml%2FPTO%2Fsrchnum.htm&r=1&f=G&l=50&s1=10,765,149.PN.&OS=PN/10,765,149&RS=PN/10,765,149
Adani Systems Assigned Patent for X-ray Defectoscope (Defect Scanner) for Protective Clothing
ALEXANDRIA, Va., Sept. 14 -- Adani Systems, Alexandria, Virginia, has been assigned a patent (No. 10,768,123, initially filed Aug. 30, 2018) by two co-inventors for "X-ray defectoscope (defect scanner) for protective clothing." The co-inventors are Vladimir N. Linev, Minsk, Belarus, and Leonid Kourtch, Minsk, Belarus.

The full-text of the patent can be found at http://patft.uspto.gov/netacgi/nph-Parser?Sect1=PTO1&Sect2=HITOFF&d=PALL&p=1&u=%2Fnetahtml%2FPTO%2Fsrchnum.htm&r=1&f=G&l=50&s1=10,768,123.PN.&OS=PN/10,768,123&RS=PN/10,768,123