Voltage Contrast Metrology Mark
Copyright © Targeted News Service 2024
2024-12-17
ALEXANDRIA, Virginia, Dec. 17 -- ASML NETHERLANDS B.V., Veldhoven, Netherlands has been assigned a patent (No. US 12169366 B2, initially filed Dec. 7, 2018) developed by four inventors Cyrus Emil Tabery, San Jose, California; Simon Hendrik Celine Van Gorp, Oud-Turnhout, Belgium; Simon Philip Spencer Hastings, San Jose, California; and Brennan Peterson, Longmont, Colorado, for "Voltage contrast metrology mark." . . .