Sunday - December 22, 2024

Error Logging for a Memory Device With On-Die Wear Leveling

2024-12-03

ALEXANDRIA, Virginia, Dec. 3 -- MICRON TECHNOLOGY, INC., Boise, Idaho has been assigned a patent (No. US 12159039 B2, initially filed April 27, 2022) developed by five inventors Bryan David Kerstetter, Kuna, Idaho; Donald M. Morgan, Meridian, Idaho; Alan J. Wilson, Boise, Idaho; John David Porter, Boise, Idaho; and Jeffrey P. Wright, Boise, Idaho, for "Error logging for a memory device with on-die wear leveling." . . .

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Error Logging for a Memory Device With On-Die Wear Leveling

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