Sunday - December 22, 2024

Image-Based Defect Detections in Additive Manufacturing

2024-12-03

ALEXANDRIA, Virginia, Dec. 3 -- SIEMENS INDUSTRY SOFTWARE INC., Plano, Texas has been assigned a patent (No. US 12159390 B2, initially filed July 25, 2019) developed by seven inventors Gaurav Ameta, Robbinsville, New Jersey; Suraj Ravi Musuvathy, Princeton Junction, New Jersey; Elena Arvanitis, Somerville, New Jersey; David Madeley, Louth, United Kingdom; Omar Fergani, Berlin, Germany; Tom van 't Erve, Enschede, Netherlands; and Livio Dalloro, Plainsboro, New Jersey, for "Image-based defect det . . .

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Image-Based Defect Detections in Additive Manufacturing

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