Sunday - December 22, 2024

Configured Time Gap for SI Beam Failure Measurement and Indication

2024-12-03

ALEXANDRIA, Virginia, Dec. 3 -- QUALCOMM INC., San Diego, California has been assigned a patent (No. US 12160759 B2, initially filed Aug. 5, 2021) developed by three inventors Qian Zhang, Basking Ridge, New Jersey; Yan Zhou, San Diego, California; and Tao Luo, San Diego, California, for "Configured time gap for SI beam failure measurement and indication." . . .

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Configured Time Gap for SI Beam Failure Measurement and Indication

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