Monday - December 23, 2024

Detect Whether Die or Channel Is Defective to Confirm Temperature Data

2024-11-19

ALEXANDRIA, Virginia, Nov. 19 -- MICRON TECHNOLOGY, INC., Boise, Idaho has been assigned a patent (No. US 12148495 B2, initially filed March 6, 2023) developed by three inventors Venkata Naga Lakshman Pasala, Milpitas, California; Wei Wang, Dublin, California; and Jiangli Zhu, San Jose, California, for "Detect whether die or channel is defective to confirm temperature data." . . .

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Detect Whether Die or Channel Is Defective to Confirm Temperature Data

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