Monday - December 23, 2024

Integrated Substrate Measurement System

2024-11-19

ALEXANDRIA, Virginia, Nov. 19 -- APPLIED MATERIALS, INC., Santa Clara, California has been assigned a patent (No. US 12148647 B2, initially filed Jan. 25, 2022) developed by seven inventors Patricia Schulze, Giddings, Texas; Gregory John Freeman, Austin, Texas; Michael Kutney, Santa Clara, California; Arunkumar Ramachandraiah, Bengaluru, India; Chih Chung Chou, San Jose, California; Zhaozhao Zhu, Milpitas, California; and Ozkan Celik, Cedar Park, Texas, for "Integrated substrate measurement sys . . .

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