Monday - December 23, 2024

Testing Circuit for a Memory Device

2024-11-12

ALEXANDRIA, Virginia, Nov. 12 -- MICRON TECHNOLOGY, INC., Boise, Idaho has been assigned a patent (No. US 12142332 B2, initially filed Sept. 7, 2022) developed by Chunqiang Weng, Shanghai, China, and Jingwei Cheng, Shanghai, China, for "Testing circuit for a memory device." . . .

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Testing Circuit for a Memory Device

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