Wednesday - December 25, 2024

Integrated Substrate Measurement System to Improve Manufacturing Process Performance

2024-11-05

ALEXANDRIA, Virginia, Nov. 5 -- APPLIED MATERIALS, INC., Santa Clara, California has been assigned a patent (No. US 12136557 B2, initially filed June 15, 2023) developed by six inventors Upendra V. Ummethala, Cupertino, California; Blake Erickson, Gilroy, California; Prashanth Kumar, Union City, California; Michael Kutney, Santa Clara, California; Steven Trey Tindel, Austin, Texas; and Zhaozhao Zhu, Milpitas, California, for "Integrated substrate measurement system to improve manufacturing proc . . .

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Integrated Substrate Measurement System to Improve Manufacturing Process Performance

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