Wednesday - December 25, 2024

In-Line Monitoring of OLED Layer Thickness and Dopant Concentration

2024-11-05

ALEXANDRIA, Virginia, Nov. 5 -- APPLIED MATERIALS, INC., Santa Clara, California has been assigned a patent (No. US 12137601 B2, initially filed June 8, 2023) developed by five inventors Yeishin Tung, San Jose, California; Byung Sung Kwak, Portland, Oregon; Robert Jan Visser, Menlo Park, California; Gangadhar Banappanavar, Durham, United Kingdom; and Dinesh Kabra, Mumbai, India, for "In-line monitoring of OLED layer thickness and dopant concentration." . . .

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In-Line Monitoring of OLED Layer Thickness and Dopant Concentration

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