Friday - December 27, 2024

Surface Metrology Systems and Methods Thereof

2024-10-22

ALEXANDRIA, Virginia, Oct. 22 -- OPTIPRO SYSTEMS, LLC, Ontario, New York has been assigned a patent (No. US 12123701 B2, initially filed Aug. 12, 2021) developed by James Fredric Munro, Ontario, New York, for "Surface metrology systems and methods thereof." . . .

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