PISCATAWAY, New Jersey, May 24 -- IEEE Electron Device Letters, a peer-reviewed journal from the Institute of Electrical and Electronics Engineers that says it features electron and ion integrated circuit devices and interconnects, published research articles, including the following topics, in its June 2021 edition:

* Analysis and Optimization of Temporary Read Errors in 3D NAND Flash Memories

* Comprehensive Benchmarking Method for the Net Combination of Mobility Enha . . .

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