Enhanced Data Reliability in Multi-Level Memory Cells
Copyright © Targeted News Service 2024
2024-04-16
ALEXANDRIA, Virginia, April 16 -- MICRON TECHNOLOGY, INC., Boise, Idaho has been assigned a patent (No. US 11960398 B2, initially filed Aug. 21, 2020) developed by Deping He, Boise, Idaho, and David Aaron Palmer, Boise, Idaho, for "Enhanced data reliability in multi-level memory cells." . . .