Systems and Methods for High Precision Optical Characterization of Carrier Transport Properties in Semiconductor Manufacturing
Copyright © Targeted News Service 2024
2024-03-26
ALEXANDRIA, Virginia, March 26 -- An inventor from Austin, Texas, William W. Chism, II has been awarded a patent (No. US 11940488 B2, initially filed May 31, 2022) for "Systems and methods for high precision optical characterization of carrier transport properties in semiconductor manufacturing." . . .