Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (AFM-nDMA)
Copyright © Targeted News Service 2024
2024-03-26
ALEXANDRIA, Virginia, March 26 -- BRUKER NANO, INC., Goleta, California has been assigned a patent (No. US 11940461 B2, initially filed April 11, 2023) developed by four inventors Sergey Osechinskiy, Goleta, California; Anthonius Ruiter, Goleta, California; Bede Pittenger, Goleta, California; and Syed-Asif Syed-Amanulla, Minneapolis, Minnesota, for "Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)." . . .