Abnormal Wafer Image Classification
Copyright © Targeted News Service, 2024
2024-04-30
Copyright © Targeted News Service, 2024
2024-04-30
ALEXANDRIA, Virginia, April 30 -- PDF SOLUTIONS, INC., Santa Clara, California has been assigned a patent (No. US 11972552 B2, initially filed April 22, 2021) developed by four inventors Tomonori Honda, Santa Clara, California; Richard Burch, McKinney, Texas; Qing Zhu, Rowlett, Texas; and Jeffrey Drue David, San Jose, California, for "Abnormal wafer image classification." . . .